Gatan Inc.
 
 

Technological advances in electron detectors are transforming the way we look at materials using transmission electron microscopy. Specifically, the revolution in direct detection electron counting cameras has enabled imaging modes that had only been theorized before, and this is allowing us to access a plethora of information from a variety of materials. By replacing the analogue signal from each primary electron with a discrete count, the direct detectors have dramatically lifted the DQE of the camera across all spatial frequencies. As a consequence, the number of electrons in the electron beam can be reduced and used to illuminate a range of radiation-sensitive materials, e.g., soft/hard hybrid materials. The high speed and efficiency of direct detectors in combination with the widespread availability of computational power have also enabled acquisition of large-scale four-dimensional (4D) STEM datasets, providing a multitude of information in one experiment.

In this webinar, we will cover many examples of usage of direct detection cameras at Northwestern University, from imaging of soft materials to special applications of 4D-STEM in hybrid interfaces. In particular, we will cover the performance of the new Gatan K3 IS, which allows acquisition of in-situ imaging and 4D STEM data in counted mode with high temporal resolution.

Presenter
Roberto dos Reis, Ph.D., Department of Materials Science and Engineering
Northwestern University

  
What Applications of Direct Detectors in Material Science
When Nov 20 2019 8:00 AM - 9:00 AM (PST)
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